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mufuyuan@rudeertek.com | Технические характеристики | |
| Спектральные характеристики: | |
| Roman Wavelength Range | 60-5000cm-1Typical Value |
| Optical Resolution: | ≤1.5cm-1(@585.25@1800Grating) |
| Spatial Resolution | <1μm (X/Y),<2μm (z) |
| Детектор: | |
| SNR(SiSiThird-Order Peak | >30:1 |
| Laser | Standard configuration: 532nm(100mW TEM00) |
| Microscope | Standard Configuration: Upright Microscope |
| Detector Type: | TE Deep-cooled Back-illuminated CCD (LDC-DTechnology)) |
| Эффективный пиксель | 2000×256 |
| Размер пикселя | 15×15μm |
| Quantum Efficiency | 95%@780nm |
| Power supply | 220V |
| Operating EnvironmentRequirements | Temperature: 20+5°C Humidity: Not exceeding RH85% Keep away from high-power electricalappliances,Keep away from vibration sources |
| Операционная система | 32/64-бит Windows 7/10/11 |
Mapping Imaging
Sample: MoS2
Spectral detection range: 60-5000cm-1
Integration time:1s
Laser wavelength:532nm
Scanning range:10μmx10μm
The values in the table are based on pre-configured prototype testing results and can be adjusted according to requirements. Please contact us for customized solutions.